Prof. Xiangyu Su had attend the Conference on Advanced Phase Measurement Methods in Optics and Imaging invited by the meeting between 17 and 21 May 2010. The main conference objectives are to:
1.stimulate discussion among different branches of metrology.
2.further the understanding of the general concept of phase.
3.present the state of the art through key note and invited lectures.
4.discuss emerging research topics and trends.
